Electrical Testing Verifies Correct Mounting Populated Board Testing System
- Quickly complete programs that take into account component height
- Automatically calculate arm interference (when used with the UA1780)
- Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
- High-speed testing at up to 0.025 sec./step
- Detect IC lead float and pseudo-contact states
- Support for active testing (optional feature)
- High-precision probing
- Large testing area of 510 × 460 mm (FA1240-61)
- Standard transport capability
- Automatic alignment function and simple visual test function


