High-Performance SMUs for Semiconductor and Electronic Device Testing
The ADCMT 6241A and 6242 are precision source measure units that combine bipolar voltage/current sourcing with voltage, current, and resistance measurement for semiconductor, electronic-component, battery, and production test applications.
Both models provide 4½-digit source resolution, 5½-digit measurement, basic source and measurement accuracy of ±0.02%, and pulse generation and measurement with a minimum pulse width of 50 μs.
50 μs
Minimum pulse source and measurement width
1 μV / 100 pA
Minimum voltage and current measurement resolution
±32 V / ±500 mA
6241A for higher-voltage device evaluation
±6 V / ±5 A
6242 for high-current device evaluation
The 6241A provides output up to ±32 V and ±500 mA, while the 6242 supports up to ±6 V and ±5 A. This allows users to select the model according to whether the application requires higher voltage or higher current.
DC, pulse, DC sweep, and pulse sweep operation are supported together with fixed, linear, random, and two-slope linear sweep patterns. Independent HI and LO limiters and selectable output-suspend states help protect batteries, laser diodes, capacitors, and other sensitive devices.
Precision Source and Measurement
Select voltage or current sourcing together with voltage, current, or resistance measurement for flexible electronic-device characterization.
50 μs Pulse Operation
Generate and measure pulses with widths down to 50 μs in 1 μs steps, supporting device characterization while minimizing self-heating.
High-Resolution Measurement
Measure voltage with resolution down to 1 μV and current down to 100 pA for low-level semiconductor and electronic-component testing.
Flexible Sweep Functions
DC, pulse, DC sweep, and pulse sweep modes support fixed, linear, random, and two-slope linear sweep patterns.
Independent HI / LO Limiters
Configure independent high and low voltage or current limits to help prevent battery over-discharge, reverse voltage, and excessive device stress.
Selectable Suspend Modes
Choose STBY, HiZ, or LoZ output-off states to reduce unnecessary relay switching and improve test throughput.
High-Voltage and High-Current Models
Select the 6241A for up to ±32 V / ±500 mA or the 6242 for up to ±6 V / ±5 A operation.
Synchronized Multi-Unit Testing
Synchronize multiple units through trigger connections for transistor, FET, and multi-terminal device characterization.
USB and GPIB Interfaces
Standard USB and GPIB interfaces support automated production and laboratory measurement systems.
Transistor DC characteristic evaluation
FET characteristic measurement
Semiconductor I-V characterization
Low-current gate measurement
Battery charge and discharge evaluation
Laser diode characterization
Low-resistance measurement
Automated production testing
| Specification | 6241A | 6242 |
|---|---|---|
| Source Resolution | 4½ digits | 4½ digits |
| Output Method | Bipolar source / sink | Bipolar source / sink |
| Maximum Voltage Output | ±32 V / 0.5 A | ±6 V / 5 A |
| Maximum Current Output | ±0.5 A / 32 V | ±5 A / 6 V |
| Minimum Source Resolution | 10 μV / 1 nA | 10 μV / 1 nA |
| Measurement Resolution | 5½ digits | 5½ digits |
| Basic Accuracy | ±0.02% | ±0.02% |
| Minimum Voltage Measurement Resolution | 1 μV | 1 μV |
| Minimum Current Measurement Resolution | 100 pA | 100 pA |
| Resistance Measurement | 2 μΩ to 1.6 GΩ | 0.2 μΩ to 304 MΩ |
| Minimum Pulse Width | 50 μs | 50 μs |
| Minimum Pulse Cycle | 2 ms; 500 μs without measurement | 2 ms; 500 μs without measurement |
| Interfaces | USB, GPIB | USB, GPIB |
