5½-Digit Electrometer for Low-Current and High-Impedance Measurement
The ADCMT 5350 is a 5½-digit digital electrometer designed for low-current, high-impedance voltage, semiconductor leakage, optical-device, and materials research applications.
Its current measurement range extends from 1 fA to 20 mA, enabling both ultra-low leakage-current measurement and characterization of semiconductor devices operating at substantially higher current levels.
1 fA to 20 mA
Wide-range current measurement
≥1013 Ω
High input impedance for voltage measurement
1,000 readings/s
Maximum high-speed sampling
100,000 Data
Large internal measurement memory
For high-output-impedance voltage sources, the driving-guard function reduces the effect of cable capacitance and improves measurement response. Voltage measurement covers up to 20 V with an input impedance of 1013 Ω or higher.
Variable integration from 500 μs to 3.2 s supports accurate average measurement of pulsed voltage or current. Standard USB and GPIB interfaces allow the 5350 to be used in laboratory and automated test systems.
1 fA to 20 mA Current Measurement
Measure ultra-low leakage current down to 1 fA while retaining enough range for semiconductor and electronic-device measurements up to 20 mA.
High-Input-Impedance Voltage Measurement
Voltage input impedance of 1013 Ω or higher minimizes loading errors when measuring high-output-impedance devices and sources.
Driving Guard
Drive the inner shield of the double-shielded input cable at the input potential to reduce effective cable capacitance and improve voltage measurement response.
Variable Integration
Set A/D integration time from 500 μs to 3.2 s in 100 μs steps for accurate average measurement of pulsed voltage and current.
High-Speed Sampling
Capture measurement data at rates up to 1,000 readings per second for transient and dynamic signal analysis.
100,000-Data Memory
Store up to 100,000 measurements internally for extended acquisition without continuous PC communication.
Analog Signal Outputs
AMP OUT provides preamplifier output for impedance conversion or current-to-voltage conversion, while D/A OUT provides an isolated ±1 V representation of measured data.
USB and GPIB Interfaces
Standard USB and GPIB interfaces support automated data acquisition, component testing, and laboratory integration.
Semiconductor leakage-current measurement
MOSFET gate-current measurement
Photodiode I-V characterization
Photomultiplier tube current measurement
Capacitor dielectric-absorption measurement
High-impedance voltage measurement
Materials and device research
Electronic component evaluation and screening
| Display | 5½ digits |
|---|---|
| Voltage Measurement Range | 1 μV to 20 V |
| Voltage Input Impedance | 1013 Ω or higher |
| Current Measurement Range | 1 fA to 20 mA |
| Current Measurement Method | Feedback method |
| Maximum Sampling Rate | 1,000 readings/s |
| Variable Integration | 500 μs to 3.2 s |
| Internal Data Memory | 100,000 measurements |
| Analog Output | Available |
| D/A Output | Available; isolated ±1 V output |
| Interfaces | USB, GPIB; LAN optional |
