High-Voltage SMU for Semiconductor and LED Device Evaluation
The ADCMT 6247C and 6247G are precision source measure units designed for high-voltage semiconductor, LED, and electronic-device characterization, providing voltage output up to +250 V and current output up to ±320 mA.
Both models combine 4½-digit source control with 5½-digit measurement, ±0.02% basic accuracy, bipolar source and sink operation, and minimum measurement resolution of 10 μV and 10 pA.
+250 V
High-voltage source capability
±320 mA
Bipolar current source and sink operation
10 pA
Minimum current measurement resolution
50 μs
Minimum pulse source and measurement width
Voltage sourcing covers −15 V to +250 V while current sourcing supports ±320 mA. This asymmetric voltage range is particularly suited to devices requiring high positive bias together with reverse or leakage-current characterization.
Linear, fixed, random, and two-slope linear sweeps, pulse measurement, resistance measurement, and selectable suspend modes provide flexible characterization for R&D and production testing. The 6247C provides USB and RS-232 interfaces, while the 6247G provides USB and GPIB.
High-Voltage Output to +250 V
Source voltage from −15 V to +250 V for high-voltage semiconductor, LED, and electronic-device characterization.
±320 mA Source and Sink
Bipolar current sourcing and sinking up to ±320 mA supports active device testing across positive and negative operating regions.
10 pA Current Measurement
Measure leakage and low-level device current with minimum resolution down to 10 pA.
50 μs Pulse Measurement
Generate and measure pulses with a minimum width of 50 μs and 1 μs programming resolution.
Flexible Sweep Functions
Linear, fixed, random, and two-slope linear sweep modes support automated I-V and device-characteristic evaluation.
Resistance Measurement
Measure resistance up to 125 GΩ with minimum resistance resolution down to 30 μΩ.
Selectable Suspend Modes
Optimized output suspend states help reduce unnecessary relay operation and support faster automated measurement sequences.
Choice of System Interfaces
The 6247C provides USB and RS-232 connectivity, while the 6247G provides USB and GPIB for automated test-system integration.
High-voltage semiconductor characterization
LED and LED module evaluation
Semiconductor leakage-current measurement
Diode I-V characterization
High-voltage electronic component testing
Pulse-based semiconductor evaluation
Production-line device testing
Research and development characterization
| Specification | 6247C | 6247G |
|---|---|---|
| Source Resolution | 4½ digits | 4½ digits |
| Output Method | Bipolar | Bipolar |
| Voltage Output Range | −15 V to +250 V | −15 V to +250 V |
| Maximum Current | ±320 mA | ±320 mA |
| Minimum Voltage Source Resolution | 100 μV | 100 μV |
| Minimum Current Source Resolution | 100 pA | 100 pA |
| Measurement Resolution | 5½ digits | 5½ digits |
| Basic Accuracy | ±0.02% | ±0.02% |
| Minimum Voltage Measurement Resolution | 10 μV | 10 μV |
| Minimum Current Measurement Resolution | 10 pA | 10 pA |
| Resistance Measurement | Up to 125 GΩ / 30 μΩ minimum resolution | Up to 125 GΩ / 30 μΩ minimum resolution |
| Minimum Pulse Width | 50 μs | 50 μs |
| Interface | USB, RS-232 | USB, GPIB |
