High-Precision SMUs for High-Voltage and High-Current Device Evaluation
The ADCMT 6253 and 6254 combine precision voltage/current sourcing with simultaneous voltage and current measurement for semiconductor, electronic component, battery, and power-device characterization.
Both models provide 5½-digit source resolution and 6½-digit measurement, bipolar source and sink operation, high-speed pulse generation, programmable sweeps, and variable integration for average-current measurement.
5½ / 6½ Digits
High-resolution source and measurement
25 μs
Minimum pulse source and measurement width
±110 V / ±2 A
6253 high-voltage source capability
±20 A
6254 high-current source capability
The 6253 is optimized for applications requiring higher voltage, supporting voltage up to ±110 V and current up to ±2 A depending on the operating region. The 6254 emphasizes high-current testing, supporting currents up to ±20 A and voltage up to ±20 V.
Twin A/D converters enable parallel voltage and current measurement. Variable integration from 100 μs to 1000 ms supports accurate average-current measurement without waveform omissions caused by digital sampling gaps.
5½-Digit Precision Source
High-resolution voltage and current generation supports precision semiconductor and electronic-component characterization.
6½-Digit Measurement
High-resolution monitoring of voltage and current enables detailed device-response characterization.
Simultaneous Voltage and Current Measurement
Twin A/D converters measure voltage and current in parallel instead of sequentially switching between the two quantities.
25 μs Pulse Operation
Generate and measure pulses with widths down to 25 μs for evaluation of devices where self-heating must be minimized.
Variable Slew Rate
Control voltage transition speed from 10.00 V/s to 99.99 kV/s for evaluating device behavior under controlled voltage ramps.
Variable Integration
Set integration time from 100 μs to 1000 ms for precise average-current measurement of pulsed and dynamically operating devices.
Bipolar Source and Sink Operation
Source or absorb power in positive and negative operating regions for batteries, semiconductor devices, and other bidirectional loads.
High-Voltage or High-Current Models
Select the 6253 for applications requiring up to ±110 V or the 6254 for high-current testing up to ±20 A.
Automated System Interfaces
USB and GPIB are standard, with optional LAN and RS-232 interfaces for integration into automated characterization systems.
Semiconductor I-V characterization
Power semiconductor evaluation
Diode forward-voltage testing
Battery charge and discharge characterization
Electronic component evaluation
Average current consumption measurement
Pulse-based device characterization
Automated production testing
| Specification | 6253 | 6254 |
|---|---|---|
| Source Resolution | 5½ digits | 5½ digits |
| Measurement Resolution | 6½ digits | 6½ digits |
| Output Method | Bipolar source / sink | Bipolar source / sink |
| Maximum Voltage Capability | ±110 V | ±20 V |
| Maximum Current Capability | ±2 A | ±20 A |
| High-Power Operating Point | ±110 V / 0.5 A ±2 A / 32 V |
±20 V / 7 A ±20 A / 7 V |
| Minimum Voltage Source Resolution | 5 μV | 5 μV |
| Minimum Current Source Resolution | 50 pA | 5 nA |
| Minimum Voltage Measurement Resolution | 100 nV | 100 nV |
| Minimum Current Measurement Resolution | 1 pA | 100 pA |
| Basic Accuracy | ±0.02% typical range | ±0.02% typical range |
| Minimum Pulse Width | 25 μs | 25 μs |
| Variable Integration Time | 100 μs to 1000 ms | 100 μs to 1000 ms |
| Variable Slew Rate | 10.00 V/s to 99.99 kV/s | 10.00 V/s to 99.99 kV/s |
| Interfaces | USB, GPIB; LAN / RS-232 optional | USB, GPIB; LAN / RS-232 optional |
Maximum voltage and maximum current are not simultaneously available across the entire operating range. Refer to the official operating-area specifications when determining allowable voltage/current combinations.
