SHIMADZU EDX-LE Energy Dispersive X-ray Fluorescence Spectrometer
Energy dispersive X-ray fluorescence spectrometer designed for fast RoHS/ELV screening with automated analysis, liquid-nitrogen-free detection, and a large sample chamber.
Fast and Simple X-Ray Fluorescence Screening for RoHS / ELV
The SHIMADZU EDX-LE is an energy dispersive X-ray fluorescence spectrometer designed specifically for efficient screening of elements regulated by RoHS and ELV requirements.
Automated analysis functions simplify the screening process from measurement through result evaluation. Depending on the sample, the EDX-LE can complete measurement and evaluation in as little as one minute while maintaining reliable screening performance.
RoHS / ELV Screening
Dedicated functions for regulated-element screening
As Fast as 1 Minute
Rapid measurement-to-evaluation workflow
No Liquid Nitrogen
Si-PIN semiconductor detector simplifies operation
Large Sample Chamber
Accommodates samples up to 370 × 320 × approx. 155 mm
RoHS / ELV Screening
The EDX-LE is designed specifically for screening elements regulated by RoHS and ELV requirements and includes the necessary screening functions as standard.
High-Speed Screening
Depending on the sample, the EDX-LE can complete the process from the start of measurement to results evaluation in approximately one minute.
Automatic Screening Analysis
A single operation from the Screening Analysis window automatically performs measurement and result display according to pre-registered analysis conditions.
Liquid-Nitrogen-Free Detector
The Si-PIN semiconductor detector does not require liquid nitrogen, helping reduce operating requirements and simplify routine maintenance.
Clear Pass / Fail Evaluation
Measurement results can display pass/fail judgment, concentration, and 3σ measurement variance for efficient screening workflows.
Sample Observation Function
The sample observation camera allows users to confirm the analysis position, while selectable collimators provide X-ray irradiation diameters of 1, 3, 5, or 10 mm.
Large Sample Chamber
The sample chamber accommodates samples up to 370 mm wide × 320 mm deep × approximately 155 mm high.
Expandable Analysis Functions
Optional kits support halogen and antimony screening, while the Additional Function Kit adds qualitative, quantitative, thin-film, and matching analysis functions.
RoHS Screening
Screening of regulated elements for RoHS-related material and product control.
ELV Screening
Elemental screening for applications requiring control of substances regulated under ELV requirements.
Regulated Substance Screening
Rapid X-ray fluorescence screening for controlled elements in materials, components, and manufactured products.
Halogen Screening
Chlorine and halogen-related screening when configured with the appropriate optional analysis kit.
Antimony Screening
Antimony screening together with RoHS and halogen elements using the appropriate optional configuration.
General Elemental Analysis
Qualitative, quantitative, thin-film, and material matching analysis with the optional Additional Function Kit.
| Model | EDX-LE |
|---|---|
| Instrument Type | Energy Dispersive X-Ray Fluorescence Spectrometer |
| Elements to Be Determined | Al (13) to U (92) |
| Sample Chamber Dimensions | 370 (W) × 320 (D) × approx. 155 (H) mm max. |
| Primary Filters | 5 types (6 including the open position), automatic replacement |
| Software | Screening software |
| Optional Analysis | Halogen Screening Analysis Kit |
| Optional Analysis | RoHS, Halogen and Antimony Screening Analysis Kit |
| Additional Functions | Additional Function Kit |
